Chemical identification of point defects and adsorbates on a metal oxide surface by atomic force microscopy
In: Nanotechnology, Jg. 17 H. 14, S. 3436-34412006
Detailed scanning probe microscopy tip models determined from simultaneous atom-resolved AFM and STM studies of the TiO2(110) surface
In: Physical Review B, Jg. 78 H. 4, S. 045416 ff.2008