In situ scanning-tunneling-microscopy studies of current driven mass transport in Ag
In: Journal of applied physics, Jg. 74 H. 9, S. 5476-54821993
In situ scanning-tunneling-microscopy studies of early-stage electromigration in Ag
In: Physical Review, B, Jg. 48 H. 2, S. 858-8631993The influence of surface roughness on electronic transport in thin films
In: Surface science, Jg. 269-270, S. 772-7761992