de
en
Schliessen
Detailsuche
Bibliotheken
Projekt
Impressum
Datenschutz
zum Inhalt
Detailsuche
Schnellsuche:
OK
Ergebnisliste
Titel
Titel
Inhalt
Inhalt
Seite
Seite
Im Dokument suchen
Donnermeyer, Achim: Scanning ion-conductance microscopy. 2007
Inhalt
Abstract
Introduction
Fundamentals
SICM Functional Principle
Ionic Conductance in Electrolytic Solution and Glass Capillaries
Silver--Chloride Electrodes
Electromagnetic Isolation
Phase--Sensitive Detection
SICM Control Signal and Transfer Function
Feedback Control Theory
Real--Time Computing
Experimental Materials and Methods
Experimental Setup Environment
Glass Capillaries
Nanopipette Puller
Filling Nanopipettes
Electrodes
Electrolytic Solution
Manual Probe Positioning System
Scanning Piezo Flexure Stage
Oscillating Piezo Actuator
Microelectrode Amplifier
Lock--In Amplifier
Microscope Control Hardware
Microscope Software Development Environment
Image Analysis Software
Sample Preparation
Operating the Microscope
Experimental Results and Discussion
SICM Development
Software Development
Probe Holder
Isolation and Damping
Distance--Control Signal Generation
SICM Characterization and Demonstration
Characterization of Scanning Probes
Feedback Control System Examination
Calibration of the SICM
Scanning of Support Surfaces
Combination of SICM and Fluorescence Microscopy
Determination of the SICM Resolution
Surface Chemical Mapping
Conclusion and Outlook
Bibliography
List of Figures
Abbreviations
Acknowledgements