TY  - JOUR
AB  - We determined the critical composition xc of the percolation threshold in polycrystalline AIxSi1-x thin films with a new method, using structural arguments only. The result xc = (0.55 + - 0.05) agrees with the results of the commonly used methods. Moreover, our model explains the wide spread of experimental values of xc as reported in the literature.
DA  - 1985
DO  - 10.1088/0022-3719/18/21/006
LA  - eng
IS  - 21
M2  - L657
PY  - 1985
SN  - 0022-3719
SP  - L657-L660
T2  - Journal of Physics, C: Solid State Physics
TI  - Percolation threshold and mean grain size in AlxSi1-x thin films
UR  - https://nbn-resolving.org/urn:nbn:de:0070-pub-17751475
Y2  - 2025-04-03T09:00:40
ER  -