TY  - JOUR
AB  - UHV-evaporated Ag1-xCux alloy films show a strong dependence of the crystallite sizes on the composition: In the middle of the concentration range, the mean grain size is smaller than 2 nm. The resistivity, however, is much lower than expected for such extremely-fine-grained materials (p < 9 my Omega cm). The electrical transport parameters for these films were obtained from the thickness dependence of the conductivity without any a priori assumptions. It will be shown that the electrical transport in these alloys can be well understood as a limit of the reflection model for the electrical conductivity in polycrystalline metals [G. Reiss, J. Vancea, and H. Hoffmann, Phys. Rev. Lett. 56, 2100 (1986)].
DA  - 1987
DO  - 10.1103/PhysRevB.35.9067
LA  - eng
IS  - 17
M2  - 9067
PY  - 1987
SN  - 0163-1829
SP  - 9067-9072
T2  - Physical Review , B
TI  - Electrical conduction in low-resistivity (quasiamorphous) Ag1-xCux alloys
UR  - https://nbn-resolving.org/urn:nbn:de:0070-pub-17751892
Y2  - 2024-11-22T03:02:10
ER  -