TY  - JOUR
AB  - Examples for correlations of results of Scanning Tunnelling Microscopy (STM) with thickness dependent physical properties of thin films will be discussed: surface roughness enhances the thickness dependent resistivity. This effect can be described quantitatively by STM imaging. Good agreement with a simple model of the film resistivity can be found for Au and Cr-Au films. The magnetization loops of Au-Fe-Au films depend on the preparation parameters, although RHEED indicates identical flat surfaces. STM, however, often shows different local topographies. Again a direct correlation can be established.
DA  - 1990
DO  - 10.1016/0042-207X(90)93946-G
LA  - eng
IS  - 4-6
M2  - 1322
PY  - 1990
SN  - 0042-207X
SP  - 1322-1324
T2  - Vacuum
TI  - STM on polycrystalline thin films
UR  - https://nbn-resolving.org/urn:nbn:de:0070-pub-17752248
Y2  - 2024-11-24T07:31:46
ER  -