TY  - JOUR
AB  - This letter critically discusses the topographical information obtained by scanning tunneling microscopy (STM) on surfaces with a mesoscopic roughness, i.e., in the range of some nm's. In a foregoing publication [J. Appl. Phys. 67, 1156 (1990)], we already treated the evaluation of constant current images based on the knowledge of the real surface and the shape of the tunneling tip ('tip shape limited resolution'). Now we deal with the invers problem: the reconstruction of the real surface topography based on the corresponding STM image and the tip shape, using a simple, straightforward formalism.
DA  - 1990
DO  - 10.1063/1.103390
KW  - Image processing
KW  - Scanning tunneling microscopy
KW  - Deconvolution
KW  - Roughness
KW  - Correlations
KW  - Transducers
KW  - Surface reconstruction
LA  - eng
IS  - 9
M2  - 867
PY  - 1990
SN  - 0003-6951
SP  - 867-869
T2  - Applied physics letters
TI  - Scanning tunneling microscopy on rough surfaces: deconvolution of constant current images
UR  - https://nbn-resolving.org/urn:nbn:de:0070-pub-17752369
Y2  - 2024-11-22T03:51:01
ER  -