TY  - THES
AB  - Methods to investigate the properties of thin aluminium oxide barriers on the nanometer scale were analysed. Dielectric breakdown was investigated by means of STM/STS. The lateral distribution of the barrier thickness was also determined.
DA  - 2004
KW  - Aluminiumoxide , Dünne Schicht , Tunnelmagnetowiderstand , Elektrischer Durchbruch , Rastertunnelmikroskopie , STM , Dünne Schichten , Magnetowiderstand , Rastertunnelmikroskop , Tunneleffekt , Oxidation , STM , TMR , Thin films
LA  - ger
PY  - 2004
TI  - Untersuchungen von dünnen Aluminiumoxid-Schichten
UR  - https://nbn-resolving.org/urn:nbn:de:hbz:361-5256
Y2  - 2024-11-22T03:04:50
ER  -