TY  - JOUR
AB  - The effective Q-factor of the cantilever is one of the most important figures-of-merit for a non-contact atomic force microscope (NC-AFM) operated in ultra-high vacuum (UHV). We provide a comprehensive discussion of all effects influencing the Q-factor and compare measured Q-factors to results from simulations based on the dimensions of the cantilevers. We introduce a methodology to investigate in detail how the effective Q-factor depends on the fixation technique of the cantilever. Fixation loss is identified as a most important contribution in addition to the hitherto discussed effects and we describe a strategy for avoiding fixation loss and obtaining high effective Q-factors in the force microscope. We demonstrate for room temperature operation, that an optimum fixation yields an effective Q-factor for the NC-AFM measurement in UHV that is equal to the intrinsic value of the cantilever.
DA  - 2010
DO  - 10.1088/0957-0233/21/12/125501
KW  - cantilever
KW  - Q-factor
KW  - mounting loss
KW  - force microscopy
KW  - NC-AFM
LA  - eng
IS  - 12
PY  - 2010
SN  - 0957-0233
T2  - Measurement Science and Technology
TI  - Achieving high effective Q-factors in ultra-high vacuum dynamic force microscopy
UR  - https://nbn-resolving.org/urn:nbn:de:0070-pub-29138275
Y2  - 2024-11-23T12:20:07
ER  -