TY  - JOUR
AB  - Non-contact atomic force microscopy (NC-AFM) was applied to study C-60 molecules on rutile TiO2(110). Depending on the tip-sample distance, distinctly different molecular contrasts are observed. Systematically decreasing the tip-sample distance results in contrast inversion that is obtained reproducibly on the C-60 islands. This change in contrast can be related to frequency shift versus distance (d f (z)) curves at different sample sites, unraveling crossing points in the d f (z) curves in the attractive regime. We have performed simulations based on a simple Morse potential, which reproduce the experimental results. This combined experimental and simulation study provides insight into the mechanisms responsible for molecular contrast in NC-AFM imaging. Moreover, this work demonstrates the importance of distance-dependent measurements for unambiguously identifying molecular positions within a molecular island using NC-AFM.
DA  - 2009
DO  - 10.1088/0957-4484/20/26/264010
LA  - eng
IS  - 26
M2  - 264010
PY  - 2009
SN  - 0957-4484
SP  - 264010-
T2  - Nanotechnology
TI  - Contrast inversion in non-contact atomic force microscopy imaging of C-60 molecules
UR  - https://nbn-resolving.org/urn:nbn:de:0070-pub-29138437
Y2  - 2024-11-22T03:31:14
ER  -