Manipulation of C-60 islands on the rutile TiO2 (110) surface using noncontact atomic force microscopy
In: Applied Physics Letters, Jg. 95 H. 4, S. 043110 ff.
Modification of a commercial atomic force microscopy for low-noise, high-resolution frequency-modulation imaging in liquid environment
In: Review of Scientific Instruments, Jg. 82 H. 7