Thickness-dependent effects in the work function of polycrystalline Cu-Films
In: Europhysics letters, Jg. 9 H. 4, S. 379-384
Thickness-dependent thin-film resistivity: application of quantitative scanning-tunneling-microscopy imaging
In: Physical review B, Jg. 43 H. 6, S. 5176-5179Ultrahigh vacuum scanning-tunneling microscope for in situ studies of annealing and electromigration behavior of thin films
In: Journal of Vacuum Science and Technology, B: Microelectronics and Nanometer Structures, Jg. 11 H. 1, S. 108-111