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Kimmel, Nils: Analysis of the charge collection process in solid state X-ray detectorsAnalyse des Ladungssammlungsvorgangs in Halbleiter-Röntgendetektoren. 2008
Inhalt
Kurzfassung
Abstract
Contents
Overview
1 Introduction
1.1 Motivation
1.2 Basic semiconductor structures
1.3 X–ray photon detection in silicon
1.4 Charge storage and shift in three phase CCDs
1.5 pnCCD
2 pnCCD in detail
2.1 The pixel array of a pnCCD
2.2 Electric potential in the bulk
3 The mesh experiment
3.1 Function principle
3.2 Analysis of mesh measurement data
4 Measurements
4.1 Setup for the used pnCCDs
4.2 Measurement program
4.3 Standard analysis and calibration of data
5 ‘Mesh’ data analysis
5.1 Types of reconstructed pixel maps
5.2 Precision of the generated maps
5.3 Analysis of the pixel response
6 Device simulations
6.1 Simulations of a pnCCD with 75 μm pixels
6.2 Simulations of charge drift and diffusion
7 Comparison of device simulationsand analysis results
7.1 Evaluation of ccf simulations
7.2 Separation process of a charge cloud
7.3 Photon absorption in the front-side structure
Conclusion
List of Figures
Bibliography
Danksagung