Davydok, Anton: X-ray diffraction analysis of InAs nanowiresRöntgenbeugungsanalyse von InAs Nanodrähten. 2013
Inhalt
- Front page
- Contents
- List of abbreviations
- Abstracts
- Zusammenfassung
- 1 Introduction
- 2 Nanowires growth: thermodynamics, models, structures
- 3 X-ray Diffraction: Kinematical Scattering Theory
- 3.1 Crystal structure
- 3.2 Reciprocal space
- 3.3 X-ray diffraction on crystal
- 3.4 The Laue equations and Bragg interpretation of diffraction conditions
- 3.5 Lattice sum and Laue conditions
- 3.6 Atomic form factor and structure factor
- 3.7 Crystal truncation rods
- 3.8 X-ray diffraction from zinc-blende and wurtzite structures
- 3.9 Coherence of X-ray beam
- 3.10 Reciprocal space coordinates
- 4 MOVPE Au-assisted growth of InAs NWs on GaAs[111]B substrate
- 5 The influence of growth parameters on the phase composition and defect structure of InAs nanowires grown by self-assisted molecular beam epitaxy onto Si(111)
- 5.1 As-/In-rich conditions
- 5.2 Substrate coverage
- 5.3 Substrate temperature
- 5.4 Growth rate
- 5.5 Conclusions
- 6 Structural Phase composition of InAs nanowires grown by self-assisted molecular beam epitaxy onto Si(111)
- 6.1 Introduction
- 6.2 MBE –Growth
- 6.3 Experimental technique and results
- 6.4 Simulation
- 6.5 Discussion
- 6.6 Conclusions
- Conclusions
- References
- Acknowledgments
- Appendix