Shahid, Saiqa: Development of a GEM based time projection chamber prototype using a pixelized readout systemEntwicklung einer GEM basierten Zeitprojektionskammer mit Pixelauslese-System. 2014
Inhalt
- Abstract
- Zusammenfassung
- Contents
- List of figures
- List of tables
- List of acronyms
- 1 Introduction
- 2 Particle Physics
- 2.1 The Standard Model of Particle Physics
- 2.1.1 Particles in the Standard Model
- 2.1.2 Interactions of Particles
- 2.1.3 Unanswered Questions of the Standard Model
- 2.1.4 Supersymmetrical Standard Model
- 2.2 The International Linear Collider
- 2.2.1 Motivation for a Linear Collider
- 2.2.2 Technical Parameters of the ILC
- 2.2.3 International Large Detector
- 2.3 Physics at the ILC
- 3 Interaction of Particles with Matter
- 3.1 Interaction of Photons with Gas Atoms
- 3.2 Interaction of Charged Particles with Gas Atoms
- 3.2.1 Interaction of Heavy Charged Particles with Gas Atoms
- 3.2.2 Interaction of Light Charged Particles with Gas Atoms
- 3.2.3 Number of Created Electron-Ion Pairs
- 3.3 Motion of Charge Carriers in Gases
- 3.4 Diffusion
- 3.5 Properties of Different Gas Mixtures
- 4 Time Projection Chamber
- 4.1 Working Principle of a Time Projection Chamber
- 4.2 Primary Ionisation in the TPC
- 4.3 Methods of Gas Amplification
- 4.3.1 Multi-Wires
- 4.3.2 MicroMegas
- 4.3.3 Gas Electron Multipliers
- 4.3.4 GEM Stack
- 4.3.5 Discharge Possibility
- 4.3.6 Carbon Coated GEMs
- 4.4 Ion Back Drift in TPCs
- 4.5 Possible Readout Systems for TPC
- 4.6 Advantages of a TPC
- 4.7 TPC for the International Large Detector
- 5 Experimental Setup in Siegen
- 5.1 High Voltage and Gas System
- 5.2 The Test Chamber
- 5.3 The TPC Prototype
- 5.4 Properties of the GEMs used at Siegen
- 5.5 The Timepix-Chip
- 5.5.1 Internal Structure of the Timepix-Chip
- 5.5.2 USB Readout System
- 5.5.3 Virtex-6 FPGA ML605
- 5.5.4 Software for the Readout
- 5.6 Scintillator Hodoscope for TPC Prototype
- 5.7 Ionisation Methods
- 6 Calibration of Timepix Chip
- 6.1 Timepix Operating Software
- 6.2 Threshold Equalisation
- 6.3 Charge Calibration
- 6.4 Timewalk Compensation
- 6.5 Threshold Offset Calibration
- 6.6 Time Delay Compensation
- 7 Carbon Coated GEMs
- 7.1 Creation of Carbon Layers
- 7.2 Investigation of Carbon Coating
- 7.3 Experimental Setup
- 7.4 Pad Readout Calibration of Test Chamber
- 7.5 Measurement of GEM Behaviours
- 7.6 Long Time Measurements of Gain Stability
- 8 Data with TPC Prototype
- 8.1 Calibration with USB device
- 8.2 Data with USB Device
- 8.3 Data Taking with Virtex 6 Readout System
- 8.4 MarlinTPC
- 8.5 Data Analysis with MarlinTPC
- 9 Conclusion and Outlook
- A TOS Commands
- A.1 Commands for Initialisation of Chip
- A.2 Commands for Threshold Equalisation
- A.3 Commands for Charge Calibration
- A.4 Commands for TimeWalk Compensation
- A.5 Commands for Triggered/Untriggered Measurement
- A.6 List of other Commands
- B LCIO Parameterisation
- C Calibration and Measurement Results
- C.1 Charge Calibration for Test Chamber
- C.2 Charge Distributions for Different Voltages
- C.3 Time Distribution for Different Voltages
- D TPC at University of Siegen
- D.1 Small Test Chamber
- D.2 Large TPC Prototype
- D.3 Printed Circuit Board as Base for Test Chamber
- D.4 Virtex 6 FPGA Setup
- E Data with TPC Prototype
- F Carbon Coating
- F.1 Correlation between Gas Gain and Temperature resp. Pressure
- F.2 Correlation between Gas Gain and GEM Voltage
- F.3 SICON Data Sheet
- F.4 Carbon Coating inside GEM Holes
- Bibliography