Angle and spin resolved Auger and photoelectron spectroscopy on Rb-layers by means of circularly polarized VUV radiation
In: Zeitschrift für Physik D: Atoms, Molecules and Clusters, Jg. 30 H. 2-3, S. 251-2531994
Angle- and spin-resolved photoelectron spectroscopy in rotationally resolved photoionization of HI
In: Zeitschrift für Physik D: Atoms, Molecules and Clusters, Jg. 29 H. 4, S. 275-2891994Angle-resolved measurements of the photoelectron spin polarization in the photoionization of HI molecules
In: Journal of Physics B: Atomic, Molecular and Optical Physics, Jg. 24 H. 22, S. 4793-48011991Au-induced surface state on Pt(111) revealed by spin-resolved photoemission with linearly polarized light
In: Physical Review Letters, Jg. 66 H. 20, S. 2645-26481991Au/Si(111) and the formation of silicides at the interface examined by spin-resolved photoemission
In: Applied Physics A: Materials Science and Processing, Jg. 52 H. 5, S. 323-3271991A circular polarizer for the region of windowless VUV radiation
In: Measurement Science and Technology, Jg. 3 H. 1, S. 91-971992Circularly polarized undulator radiation from the new double crossed undulator beamline at BESSY and its first use for spin resolved Auger electron emission spectroscopy
In: Nuclear Instruments and Methods in Physics Research A: Accelerators, Spectrometers, Detectors and Associated Equipment, Jg. 343 H. 2-3, S. 650-6541994Collision of oriented NO with Ni(100) and with oriented CO on Ni(100)
In: Surface Science, Jg. 269-270, S. 207-2121992Enhancement of the reflectivity of Mo/Si multilayer x-ray mirrors by thermal treatment
In: Applied Physics Letters, Jg. 58 H. 23, S. 2601-26031991Experimental verification of a spin effect in photoemission: Polarized electrons due to phase-shift differences in the normal emission from Pt(100) by unpolarized radiation
In: Physical Review B: Condensed Matter and Materials Physics, Jg. 45 H. 7, S. 3849-38521992Fabrication and characterization of Si-based soft x-ray mirrors
In: X-ray EUV optics for astronomy, microscopy, polarimetry, and projection lithography, Jg. 1343, S. 64-721991High resolution Rutherford backscattering spectroscopy studies on Mo/Si multilayers
In: Thin Solid Films, Jg. 228 H. 1-2, S. 60-631993Identification of Xe interface states in the Xe(111)/Pt(111) system by spin-resolved photoelectron spectroscopy
In: Solid State Communications, Jg. 90 H. 8, S. 523-5261994Influence of orientation on coadsorption dynamics: CO displacement from a c(2×2) precovered Ni(100) surface by free oriented NO
In: Journal of Chemical Physics, Jg. 101 H. 8, S. 7154-71601994Interface Stability and Silicide Formation in High Temperature Stable MoxSi1-x/Si Multilayer Soft X-Ray Mirrors Studied by Means of X-Ray Diffraction and HRTEM
In: Physica status solidi A: applications and materials science, Jg. 145 H. 2, S. 539-5501994Interlayer composition and interface stability in Mo/Si multilayers studied with high-resolution RBS
In: Applied Surface Science, Jg. 78 H. 2, S. 133-1401994Mo 0,5 Si 0,5/Si multilayer soft x-ray mirrors, high thermal stability, and normal incidence reflectivity
In: Applied Physics Letters, Jg. 63 H. 16, S. 2207-22091993Multimass thermal desorption spectroscopy as a monitoring device for chemical reaction products
In: Review of Scientific Instruments, Jg. 65 H. 2, S. 359-3621994A new spin effect in photoemission with unpolarized light: Experimental evidence of spin polarized electrons in normal emission from Pt(111) and Au(111)
In: Applied Physics A: Materials Science and Processing, Jg. 53 H. 5, S. 418-4211991Observation of vibrational excitation in photoelectron spectroscopy of HI+2[Pi]
In: Chemical Physics Letters, Jg. 189 H. 4-5, S. 467-4721992