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A capillary discharge tube for the production of intense VUV resonance radiation
Schönhense, G. ; Heinzmann, UlrichIn: Journal of Physics E: Scientific Instruments, Jg. 16 H. 1, S. 74-82Characterization of Symmetry Properties of Pt(111) Electron Bands by Means of Angle-, Energy-, and Spin-Resolved Photoemission with Circularly Polarized Synchrotron Radiation
Eyers, A. ; Schäfers, F. ; Schönhense, G. ; Heinzmann, Ulrich ; Oepen, H. P. ; Hünlich, K. ; Kirschner, J. ; Borstel, G.In: Physical review letters, Jg. 52 H. 17, S. 1559-1562A circular polarizer for the region of windowless VUV radiation
Döhring, T. ; Schönhense, G. ; Heinzmann, UlrichIn: Measurement Science and Technology, Jg. 3 H. 1, S. 91-97Circularly polarized undulator radiation from the new double crossed undulator beamline at BESSY and its first use for spin resolved Auger electron emission spectroscopy
David, R. ; Stoppmanns, P. ; Yu, S.-W. ; Kuntze, R. ; Müller, Norbert ; Heinzmann, UlrichIn: Nuclear Instruments and Methods in Physics Research A: Accelerators, Spectrometers, Detectors and Associated Equipment, Jg. 343 H. 2-3, S. 650-654Collision of oriented NO with Ni(100) and with oriented CO on Ni(100)
Müller, H. ; Dierks, B. ; Hamza, F. ; Zagatta, Gunther ; Fecher, G. H. ; Böwering, N. ; Heinzmann, UlrichIn: Surface Science, Jg. 269-270, S. 207-212Comment on measuring photoionization cross sections of excited atomic states
Heinzmann, Ulrich ; Schinkowski, D. ; Zeman, H. D.In: Applied physics, Jg. 12, S. 113 ff.Comment on the letter Photoionisation cross section and spin polarisation of photoelectrons from thallium by N.A. Cherenkov
Heinzmann, Ulrich ; Kessler, J.In: Journal of Physics B: Atomic, Molecular and Optical Physics, Jg. 11 H. 8, S. L265-L266Coverage dependence of the spin-resolved photoemission from epitaxially grown Ag layers on Pt(111)
Schmiedeskamp, B. ; Kessler, B. ; Vogt, B. ; Heinzmann, UlrichIn: Surface Science, Jg. 223 H. 3, S. 465-478Crystallographic order and decomposition of [MnIII6CrIII]3+ single-molecule magnets deposited in submonolayers and monolayers on HOPG studied by means of molecular resolved Atomic Force Microscopy (AFM) and Kelvin Probe Force Microscopy in UHV
Gryzia, Aaron ; Volkmann, Timm ; Brechling, Armin ; Hoeke, Veronika ; Schneider, Lilli ; Küpper, Karsten ; Glaser, Thorsten ; Heinzmann, UlrichIn: Nanoscale Research Letters, Jg. 9 H. 1