Flexible drift-compensation system for precise 3D force mapping in severe drift environments
In: Review of Scientific Instruments, Jg. 82 H. 6
Frequency-modulated atomic force microscopy operation by imaging at the frequency shift minimum: The dip-df mode
In: Review of Scientific Instruments, Jg. 85 H. 4, S. 43707 ff.From dewetting to wetting molecular layers:C60 on CaCO3(1014) as a case study
In: Physical Chemistry Chemical Physics, Jg. 14 H. 18, S. 6544-6548