Ultrahigh vacuum scanning-tunneling microscope for in situ studies of annealing and electromigration behavior of thin films
In: Journal of Vacuum Science and Technology, B: Microelectronics and Nanometer Structures, Jg. 11 H. 1, S. 108-111
Understanding atom movement during lateral manipulation with the STM tip using a simple simulation method
In: Surface Science, Jg. 499 H. 1, S. 15-23