Electronic transport in metallic films: a tool for scanning tunneling microscopy investigations
In: Superlattices and Microstructures, Jg. 11 H. 2, S. 171-174
Electronic transport properties and thickness dependence of the giant magnetoresistance in Co/Cu multilayers
In: Journal of applied physics, Jg. 75 H. 1, S. 362-367Electronic transport properties of giant-magnetoresistance Fe/Cr multilayers
In: Physical Review, B, Jg. 46 H. 17, S. 11208-11211Growth and structure of polycrystalline Cr/Au multilayered thin films
In: Thin solid films, Jg. 250 H. 1-2, S. 56-60The influence of surface roughness on electronic transport in thin films
In: Surface science, Jg. 269-270, S. 772-776Scanning tunneling microscopy on rough surfaces: quantitative image analysis
In: Journal of applied physics, Jg. 70 H. 1, S. 523-525Thickness-dependent thin-film resistivity: application of quantitative scanning-tunneling-microscopy imaging
In: Physical review B, Jg. 43 H. 6, S. 5176-5179