1 Treffer für Schlagwort = "Atomic force microscopy (AFM)"
Klassifikation
Schliessen
Filter
2

zu den Filteroptionen

Smooth crack-free targets for nuclear applications produced by molecular plating
Vascon, A. ; Santi, S. ; Isse, A. A. ; Kühnle, Angelika ; Reich, T. ; Drebert, J. ; Eberhardt, K. ; Duellmann, Ch. E.
In: Nuclear Instruments and Methods in Physics Research A, Jg. 714, S. 163-175