Scanning tunneling microscopy on rough surfaces: deconvolution of constant current images
In: Applied physics letters, Jg. 57 H. 9, S. 867-869
Ultrahigh vacuum scanning-tunneling microscope for in situ studies of annealing and electromigration behavior of thin films
In: Journal of Vacuum Science and Technology, B: Microelectronics and Nanometer Structures, Jg. 11 H. 1, S. 108-111