3 Treffer für Personen = "Lauritsen, Jeppe V."
Klassifikation
Schliessen
Filter

Chemical identification of point defects and adsorbates on a metal oxide surface by atomic force microscopy
Lauritsen, Jeppe V. ; Foster, Adam S. ; Olesen, Georg H. ; Christensen, Mona C. ; Kühnle, Angelika ; Helveg, Stig ; Rostrup-Nielsen, Jens R. ; Clausen, Bjerne S. ; Reichling, Michael ; Besenbacher, Flemming
In: Nanotechnology, Jg. 17 H. 14, S. 3436-3441
Detailed scanning probe microscopy tip models determined from simultaneous atom-resolved AFM and STM studies of the TiO2(110) surface
Enevoldsen, Georg H. ; Pinto, Henry P. ; Foster, Adam S. ; Jensen, Mona C. R. ; Kühnle, Angelika ; Reichling, Michael ; Hofer, Werner A. ; Lauritsen, Jeppe V. ; Besenbacher, Flemming
In: Physical Review B, Jg. 78 H. 4, S. 045416 ff.
Unravelling the atomic structure of cross-linked (1 x 2) TiO2(110)
Pieper, Hans Hermann ; Venkataramani, Krithika ; Torbrügge, Stefan ; Bahr, Stephan ; Lauritsen, Jeppe V. ; Besenbacher, Flemming ; Kühnle, Angelika ; Reichling, Michael
In: Physical Chemistry Chemical Physics, Jg. 12 H. 39, S. 12436-12441

Detailsuche