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Modification of a commercial atomic force microscopy for low-noise, high-resolution frequency-modulation imaging in liquid environment
Rode, Sebastian ; Stark, R. ; Lübbe, Jannis ; Tröger, Lutz ; Schütte, Jens ; Umeda, K. ; Kobayashi, Kei ; Yamada, Hirofumi ; Kühnle, Angelika
In: Review of Scientific Instruments, Jg. 82 H. 7

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