Identification of Xe interface states in the Xe(111)/Pt(111) system by spin-resolved photoelectron spectroscopy
In: Solid State Communications, Jg. 90 H. 8, S. 523-526
Interface Stability and Silicide Formation in High Temperature Stable MoxSi1-x/Si Multilayer Soft X-Ray Mirrors Studied by Means of X-Ray Diffraction and HRTEM
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In: Applied Surface Science, Jg. 78 H. 2, S. 133-140