30 Treffer für Schlagwort = "Spectroscopy" und Sammlung = Sammlungen der ULB Münster
zu den Filteroptionen30 Treffer für Schlagwort = "Spectroscopy" und Sammlung = Sammlungen der ULB Münster
Au-induced surface state on Pt(111) revealed by spin-resolved photoemission with linearly polarized light
In: Physical Review Letters, Jg. 66 H. 20, S. 2645-2648
Au/Si(111) and the formation of silicides at the interface examined by spin-resolved photoemission
In: Applied Physics A: Materials Science and Processing, Jg. 52 H. 5, S. 323-327Coverage dependence of the spin-resolved photoemission from epitaxially grown Ag layers on Pt(111)
In: Surface Science, Jg. 223 H. 3, S. 465-478Electronic Resonances in Rare-Gas Adsorbates Observed by Spin-Resolved Electron Spectroscopy
In: Physica Scripta, Jg. 35 H. 4, S. 541-546Enhancement of the reflectivity of Mo/Si multilayer x-ray mirrors by thermal treatment
In: Applied Physics Letters, Jg. 58 H. 23, S. 2601-2603Experimental verification of a new spin-polarization effect in photoemission: Polarized photoelectrons from Pt(111) with linearly polarized radiation in normal incidence and normal emission
In: Physical review letters, Jg. 60 H. 7, S. 651-654Experimental verification of a spin effect in photoemission: Polarized electrons due to phase-shift differences in the normal emission from Pt(100) by unpolarized radiation
In: Physical Review B: Condensed Matter and Materials Physics, Jg. 45 H. 7, S. 3849-3852Fabrication and characterization of Si-based soft x-ray mirrors
In: X-ray EUV optics for astronomy, microscopy, polarimetry, and projection lithography, Jg. 1343, S. 64-72High resolution Rutherford backscattering spectroscopy studies on Mo/Si multilayers
In: Thin Solid Films, Jg. 228 H. 1-2, S. 60-63Identification of Xe interface states in the Xe(111)/Pt(111) system by spin-resolved photoelectron spectroscopy
In: Solid State Communications, Jg. 90 H. 8, S. 523-526Interface Stability and Silicide Formation in High Temperature Stable MoxSi1-x/Si Multilayer Soft X-Ray Mirrors Studied by Means of X-Ray Diffraction and HRTEM
In: Physica status solidi A: applications and materials science, Jg. 145 H. 2, S. 539-550Interlayer composition and interface stability in Mo/Si multilayers studied with high-resolution RBS
In: Applied Surface Science, Jg. 78 H. 2, S. 133-140Mo 0,5 Si 0,5/Si multilayer soft x-ray mirrors, high thermal stability, and normal incidence reflectivity
In: Applied Physics Letters, Jg. 63 H. 16, S. 2207-2209A new spin effect in photoemission with unpolarized light: Experimental evidence of spin polarized electrons in normal emission from Pt(111) and Au(111)
In: Applied Physics A: Materials Science and Processing, Jg. 53 H. 5, S. 418-421Smoothing of interfaces in ultrathin Mo/Si multilayers by ion bombardment
In: Thin Solid Films, Jg. 228 H. 1-2, S. 154-157Spin polarization in the photoemission from the 5d-core levels of a thallium film
In: Zeitschrift für Physik B: Condensed Matter, Jg. 90 H. 2, S. 197-200Spin polarized photoelectrons with unpolarized light in normal emission from Pt(110)
In: Surface Science, Jg. 307-309 H. 2, S. 1114-1117Spin Resolved Auger-Spectroscopy on Rb-Layers after Core-Hole Creation by Circularly Polarized VUV-Light
In: Physica Scripta, Topical Issues, Jg. T41, S. 190-193The spin-orbit splitting in the Si bandstructure measured by means of spin-resolved photoemission
In: Solid State Communications, Jg. 76 H. 12, S. 1391-1394Spin-Polarized Photoelectrons with Circularly and Linearly Polarized Radiation from an Au Monolayer on Pt(111)
In: Europhysics letters, Jg. 20 H. 7, S. 657-662