8 Titel in Klassifikation (DDC) → Naturwissenschaften und Mathematik → Physik → Physik KlassifikationSchliessenFilter2
zu den Filteroptionen8 Titel in Klassifikation (DDC) → Naturwissenschaften und Mathematik → Physik → Physik
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Identification of Xe interface states in the Xe(111)/Pt(111) system by spin-resolved photoelectron spectroscopy
Kessler, B. ; Müller, Norbert ; Schmiedeskamp, B. ; Heinzmann, UlrichIn: Solid State Communications, Jg. 90 H. 8, S. 523-526In situ scanning-tunneling-microscopy studies of current driven mass transport in Ag
Levine, L. E. ; Reiss, Günter ; Smith, D. A.In: Journal of applied physics, Jg. 74 H. 9, S. 5476-5482In situ scanning-tunneling-microscopy studies of early-stage electromigration in Ag
Levine, L. E. ; Reiss, Günter ; Smith, D. A.In: Physical Review, B, Jg. 48 H. 2, S. 858-863Inelastic J/Psi production in deep inelastic scattering from hydrogen and deuterium and the gluon distribution of free nucleons
Allasia, D. ; Amaudruz, P. ; Arneodo, M. ; Arvidson, A. ; Badelek, B. ; Baum, Günter ; Beaufays, J. ; Bird, I.G. ; Botje, M. ; Broggini, C. ; Bruckner, W. ; Brüll, A. ; Burger, W. J. ; Ciborowski, J. ; Crittenden, R. ; Dantzig, R. van ; Döbbeling, H. ; Domingo, J. ; Drinkard, J. ; Dzierba, A. [...]In: Phys.Lett. B, Jg. 258 H. 3-4, S. 493-498Influence of orientation on coadsorption dynamics: CO displacement from a c(2×2) precovered Ni(100) surface by free oriented NO
Müller, H. ; Dierks, B. ; Fecher, G. H. ; Böwering, N. ; Heinzmann, UlrichIn: Journal of Chemical Physics, Jg. 101 H. 8, S. 7154-7160The influence of surface roughness on electronic transport in thin films
Reiss, Günter ; Brückl, HubertIn: Surface science, Jg. 269-270, S. 772-776Interface Stability and Silicide Formation in High Temperature Stable MoxSi1-x/Si Multilayer Soft X-Ray Mirrors Studied by Means of X-Ray Diffraction and HRTEM
Kleineberg, U. ; Stock, H. J. ; Kloidt, A. ; Schmiedeskamp, B. ; Heinzmann, Ulrich ; Hopfe, S. ; Scholz, R.In: Physica status solidi A: applications and materials science, Jg. 145 H. 2, S. 539-550Interlayer composition and interface stability in Mo/Si multilayers studied with high-resolution RBS
Heidemann, B. ; Tappe, T. ; Schmiedeskamp, B. ; Heinzmann, UlrichIn: Applied Surface Science, Jg. 78 H. 2, S. 133-140